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A comparison of reaction rate calculations using ENDF/B-VII with critical assembly measurements

C. Wilkerson, M. Mac Innes, D. Barr, H. Trellue, R. MacFarlane and M. Chadwick

International Conference on Nuclear Data for Science and Technology, (2007) 841-844

DOI: https://doi.org/10.1051/ndata:07332

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