Open Access
ND 2007
Article Number 339
Number of page(s) 4
Section Space and electronics applications
Published online 17 June 2008
International Conference on Nuclear Data for Science and Technology 2007
DOI: 10.1051/ndata:07695

Nucleon induced recoil ions in microelectronics

Frédéric Wrobel

LPES-CRESA, University of Nice, Sophia-Antipolis, France

Published online: 21 May 2008

Nucleon induced nuclear reactions in microelectronic devices is a real concern for the radiation community. These nuclear reactions can provoke failures in critical applications in planes and satellites. Nuclear codes are very powerful tools which are required to calculate the number of failures of a given device in a given environment. We present the MC-RED code which is dedicated to the Monte Carlo description of nuclear reactions in microelectronic devices. We also show how its results can be use to calculate the failure rate.

© CEA 2008

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.