Open Access
Issue
ND 2007
2007
Article Number 339
Number of page(s) 4
Section Space and electronics applications
DOI https://doi.org/10.1051/ndata:07695
Published online 17 June 2008
International Conference on Nuclear Data for Science and Technology 2007
DOI: 10.1051/ndata:07695

Nucleon induced recoil ions in microelectronics

Frédéric Wrobel

LPES-CRESA, University of Nice, Sophia-Antipolis, France


Published online: 21 May 2008

Abstract
Nucleon induced nuclear reactions in microelectronic devices is a real concern for the radiation community. These nuclear reactions can provoke failures in critical applications in planes and satellites. Nuclear codes are very powerful tools which are required to calculate the number of failures of a given device in a given environment. We present the MC-RED code which is dedicated to the Monte Carlo description of nuclear reactions in microelectronic devices. We also show how its results can be use to calculate the failure rate.



© CEA 2008

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