Open Access
ND 2007
Article Number 338
Number of page(s) 6
Section Space and electronics applications
Published online 17 June 2008
International Conference on Nuclear Data for Science and Technology 2007
DOI: 10.1051/ndata:07727

Use of nuclear data for space and aeronautic designs

M.C. Palau1, Th. Carriere1, N. Buard2, C. Weulersse2, F. Saigne3 and F. Wrobel4

1  Astrium ST, 78133 Les Mureaux, France
2  EADS IN, 92000 Suresnes, France
3  CEM2, 34000 Montpellier, France
4  LPES, Nice University, France

Published online: 21 May 2008

Until recently, the effects of radiation environment on on-board electronics on launchers and aircraft had not been seriously taken into account. The situation has changed. And one of the most significant effects observed on on-board electronics is what we call Single Event Upset (SEU). This talk explains how the combination of electrical sensitivity of components and nuclear physics is important in the calculation of SEU rates, and emphasizes the aspects of nuclear physics useful to give the probability for a dangerous event to occur. Some circumvention methods will be rapidly identified.

© CEA 2008

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