Open Access
| Issue |
ND 2007
2007
|
|
|---|---|---|
| Article Number | 339 | |
| Number of page(s) | 4 | |
| Section | Space and electronics applications | |
| DOI | https://doi.org/10.1051/ndata:07695 | |
| Published online | 17 June 2008 | |
International Conference on Nuclear Data for Science and Technology 2007
DOI: 10.1051/ndata:07695
LPES-CRESA, University of Nice, Sophia-Antipolis, France
Published online: 21 May 2008
© CEA 2008
DOI: 10.1051/ndata:07695
Nucleon induced recoil ions in microelectronics
Frédéric WrobelLPES-CRESA, University of Nice, Sophia-Antipolis, France
Published online: 21 May 2008
Abstract
Nucleon induced nuclear reactions in microelectronic devices is a real concern for the radiation community. These nuclear reactions can provoke failures in critical applications in planes and satellites. Nuclear codes are very powerful tools which are required to calculate the number of failures of a given device in a given environment. We present the MC-RED code which is dedicated to the Monte Carlo description of nuclear reactions in microelectronic devices. We also show how its results can be use to calculate the failure rate.
© CEA 2008