Nucleon induced recoil ions in microelectronicsFrédéric Wrobel
LPES-CRESA, University of Nice, Sophia-Antipolis, France
Published online: 21 May 2008
Nucleon induced nuclear reactions in microelectronic devices is a real concern for the radiation community. These nuclear reactions can provoke failures in critical applications in planes and satellites. Nuclear codes are very powerful tools which are required to calculate the number of failures of a given device in a given environment. We present the MC-RED code which is dedicated to the Monte Carlo description of nuclear reactions in microelectronic devices. We also show how its results can be use to calculate the failure rate.
© CEA 2008