Use of nuclear data for space and aeronautic designs

Abstract
Until recently, the effects of radiation environment on on-board electronics on launchers and aircraft had not been seriously taken into account. The situation has changed. And one of the most significant effects observed on on-board electronics is what we call Single Event Upset (SEU). This talk explains how the combination of electrical sensitivity of components and nuclear physics is important in the calculation of SEU rates, and emphasizes the aspects of nuclear physics useful to give the probability for a dangerous event to occur. Some circumvention methods will be rapidly identified.